This is the program for the 2010 Joint Statistical Meetings in Vancouver, British Columbia.

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Keyword Search Criteria: repeated measurement returned 4 record(s)
Monday, 08/02/2010
Evaluation of Individual Observer Agreement for Matched Repeated Binary Measurements
Jingjing Gao, Emory University; Michael Haber, Emory University
8:50 AM

Sample Size Estimates for Correlated Data in a Device Trial
Xiaolong Shih, Boston Scientific Corporation
2:25 PM

Tuesday, 08/03/2010
Descriptive Discriminant Analysis for Repeated Measures Data: Effects of Non-Normality on Bias and Error in Discriminant Function Coefficients
Tolulope T. Sajobi, University of Saskatchewan; Lisa M. Lix, University of Saskatchewan; William H. Laverty, University of Saskatchewan; Longhai Li, University of Saskatchewan


Wednesday, 08/04/2010
A Statistical Approach for a Special Censoring/Truncation Problem Arising in Nondestructive Evaluation
Ming Li, Iowa State University; William Q. Meeker, Iowa State University
8:50 AM




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